傑出學術會議: VLSI、IEDM 及 ISSCC 論文

  1. Wei-Hwa Lin, Li Ci Chen, Ming-Han Ho, Hong-Shen Chen, Yu-Lun Hu, Burn Jeng Lin, Pin-Jiun Wu, Jenny Yi-Chun Liu, Yue-Der Chih, Jonathen Chang, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King*,“A Study of Self-Powered Wireless Sensing Module for On-wafer in-situ EUV Detection,” in 2022 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2022
  2. Chien-Ping Wang, Ying-Chun Shen, Kun-Lin Liou, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King*, “Hair-Like Nanostructure Based Ion Detector by 16nm FinFET Technology,” in 2020 IEEE Symposia on VLSI Technology and Circuits (VLSI), Honolulu, HI, June 2020.
  3. Chieh Lee, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin and Ya-Chin King*, “Memory-Logic Hybrid Gate with 3D-Stackable Complementary Latches for FinFET-based Neural Networks” 2019 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2019.
  4. Yi-Pei Tsai, Jiaw-Ren Shih, Ya-Chin King and Chrong Jung Lin*, “7nm FinFET Plasma Charge Recording Device” 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2018.
  5. Peng-Chun Liou, Tsung-Han Lee, Chien-Ping Wang, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King*, “High Resolution Ion Detector (HRID) by 16nm FinFET CMOS Technology” 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2018.
  6. Wei-Hao Chen, Kai-Xiang Li, Wei-Yu Lin, Kuo-Hsiang Hsu, Pin-Yi Li, Cheng-Han Yang, Cheng-Xin Xue, En-Yu Yang, Yen-Kai Chen, Yun-Sheng Chang, Tzu-Hsiang Hsu, Ya-Chin King, Chorng-Jung Lin, Ren-Shuo Liu, Chih-Cheng Hsieh, Kea-Tiong Tang, Meng-Fan Chang, “A 65nm 1Mb nonvolatile computing-in-memory ReRAM macro with sub-16ns multiply-and-accumulate for binary DNN AI edge processors,” 2018 IEEE International Solid – State Circuits Conference – (ISSCC), San Francisco, CA, April 2018, pp. 494-496.

期刊論文

  1. Kai-Wei Yang, Ting Gan, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King, ”Polarity and Patterning Effect on Plasma Charging Levels by Metal-Gate Coupled Recorder Arrays,” in IEEE Transactions on Electron Devices (TED), doi: 10.1109/TED.2022.3215486, Oct. 2022.
  2. Ying-Chun Shen, Chien-Ping Wang, Kun-Lin Liou, Po-Hung Tan, Yi-Chung Wang, Shu-Chi Wu, Tzu-Yi Yang, Yi-Jen Yu, Tsung-Yu Chiang, Yue-Der Chih, Jonathan Chang, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King*and Yu-Lun Chueh*, “Multifunctional Ion-Sensitive Floating Gate Fin Field-Effect Transistor with Three-Dimensional Nanoseaweed Structure by Glancing Angle Deposition Technology,” in Small, vol. 18, no. 5, pp. 2104168, Feb. 2022.
  3. Chien-Ping Wang, Burn Jeng Lin, Pin-Jiun Wu, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Linand Ya-Chin King*, “Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology,” in Nanoscale Research Letters (NRL), vol. 17, pp. 5, Jan. 2022.
  4. Po-Hung Tan, Che-Hao Hsu, Ying-Chun Shen, Chien-Ping Wang, Kun-Lin Liou, Jiaw-Ren Shih, Chrong Jung Lin, Ling Lee, Kuangye Wang, Hong-Min Wu, Tsung-Yu Chiang, Yue-Der Chih, Jonathan Chang, Ya-Chin King*and Yu-Lun Chueh*, “Complementary Metal–Oxide–Semiconductor Compatible 2D Layered Film-Based Gas Sensors by Floating-Gate Coupling Effect,” in Advanced Functional Materials (AFM), pp. 2108878, Dec. 2021.
    (Early Access, doi: https://doi.org/10.1002/adfm.202108878)
  5. Chien-Ping Wang, Wei-Hwa Lin, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Linand Ya-Chin King*, “Battery-Less Electronic Layer Detectors Array (ELDA) for In-Tool DUV Detection by FinFET CMOS Technology,” in IEEE Transactions on Electron Devices (TED), vol. 68, no. 10, pp. 4972-4976, Oct. 2021.
  6. Shi Jiun Wang, Chih-An Yang, Burn Jeng Lin, Chrong-Jung Linand Ya-Chin King*, “On-Wafer Electron Beam Detectors by Floating-Gate FinFET Technologies,” in IEEE Transactions on Electron Devices (TED), vol. 68, no. 9, pp. 4651-4655, Sept. 2021.
  7. Yun-Feng Kao, Jiaw-Ren Shih, Chrong Jung Linand Ya-Chin King*, “An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array,” in Nanoscale Research Letters (NRL), vol. 16, pp. 114, July 2021.
  8. Yi-Jie Chao, Kai-Wei Yang, Chi Su, Chrong-Jung Linand Ya-Chin King*, “Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes,” in Nanoscale Research Letters (NRL), vol. 16, pp. 112, July 2021.
  9. Chien-Ping Wang, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Linand Ya-Chin King*, “Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology,” in Nanoscale Research Letters (NRL), vol. 16, pp. 93, May 2021.
  10. Chi Su*, Yi-Pei Tsai, Chrong-Jung Lin and Ya-Chin King, “Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes,” in Nanoscale Research Letters (NRL), vol. 15, pp. 96, May 2020.
  11. Yun-Feng Kao, Chrong Jung Lin and Ya-Chin King*, “Reset Variability in Backfilled Resistive Random Access Memory and Its Correlation to Low Frequency Noise in Read,” in IEEE Journal of the Electron Devices Society (JEDS), vol. 8, pp. 465-473, May 2020
  12. Chien-Ping Wang, Yi-Pei Tsai, Burn Jeng Lin, Zheng-Yong Liang, Po-Wen Chiu, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King*, “On-Wafer FinFET-Based EUV/eBeam Detector Arrays for Advanced Lithography Processes,” in IEEE Transactions on Electron Devices (TED), vol. 67, no. 6, pp. 2406-2413, June 2020.
  13. Chieh Lee, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin and Ya-Chin King*, “Memory-Logic Hybrid Gate With 3-D Stackable Complementary Latches,” in IEEE Transactions on Electron Devices (TED), June 2020.
  14. Yi-Pei Tsai, Jiaw-Ren Shih, Ya-Chin King and Chrong-Jung Lin*, “Plasma Charge Accumulative Model in Quantitative FinFET Plasma Damage,” in IEEE Transactions on Electron Devices (TED), vol. 66, no. 8, pp. 3492-3497, Aug. 2019.
  15. Po-Shao Yeh, Chih-An Yang, Yi-Hong Chang, Yue-Der Chih, Chrong-Jung Lin and Ya-Chin King*, “Self-Convergent Trimming SRAM True Random Number Generation with In-Cell Storage,” in IEEE Journal of Solid-State Circuits, vol. 54, no. 9, pp. 2614-2621, Sept. 2019.
  16. Ren-Jay Kuo, Fu-Cheng Chang, Ya-Chin King and Chrong-Jung Lin*, “Antifuse OTP Cell in a Cross-Point Array by Advanced CMOS FinFET Process,” in IEEE Transactions on Electron Devices (TED) 66, no. 4, pp. 1729-1733, April 2019.
  17. Chih Yuan Chen, Chrong-Jung Lin, Ya-Chin King*, “RTN and Annealing Related to Stress and Temperature in FIND RRAM Array”, Nanoscale Research Letter (NRL), vol. 14, pp. 12, Jan 2019.
  18. Yu-Fan Chiang, Wei-Yu Chien, Yue-Der Chih, Jonathan Chang, Chrong-Jung Lin, Ya-Chin King*, ”FinFET CMOS logic gates with non-volatile states for reconfigurable computing systems” Integration the VLSI journal, Dec. 2018.
  19. Yun-Feng Kao, Wei Cheng Zhuang, Chrong-Jung Lin, Ya-Chin King*, “A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model” Nanoscale Research Letter (NRL), vol. 13, pp. 213, July 2018.
  20. Yi-Pei Tsai, Peng-Chun Liou, Chrong Jung Lin and Ya-Chin King*, “Plasma Charging Effect on the Reliability of Copper BEOL Structures in Advanced FinFET Technologies,” in IEEE Journal of the Electron Devices Society (JEDS), vol. 6, pp. 875-883, July 2018.