{"id":37,"date":"2023-02-20T11:06:14","date_gmt":"2023-02-20T03:06:14","guid":{"rendered":"http:\/\/well.ee.nthu.edu.tw\/?p=37"},"modified":"2023-02-20T11:23:15","modified_gmt":"2023-02-20T03:23:15","slug":"contribution-in-expertise_king","status":"publish","type":"post","link":"https:\/\/starlab.ee.nthu.edu.tw\/?p=37","title":{"rendered":"Publications_King"},"content":{"rendered":"

\u5091\u51fa\u5b78\u8853\u6703\u8b70<\/strong>: VLSI<\/strong>\u3001<\/strong>IEDM<\/strong> \u53ca<\/strong> ISSCC <\/strong>\u8ad6\u6587<\/strong><\/p>\n

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  1. Wei-Hwa Lin, Li Ci Chen, Ming-Han Ho, Hong-Shen Chen, Yu-Lun Hu, Burn Jeng Lin, Pin-Jiun Wu, Jenny Yi-Chun Liu, Yue-Der Chih, Jonathen Chang, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King*<\/strong>,\u201cA Study of Self-Powered Wireless Sensing Module for On-wafer in-situ EUV Detection,\u201d in 2022 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2022<\/li>\n
  2. Chien-Ping Wang, Ying-Chun Shen, Kun-Lin Liou, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King<\/strong>*, \u201cHair-Like Nanostructure Based Ion Detector by 16nm FinFET Technology,\u201d in 2020 IEEE Symposia on VLSI Technology and Circuits (VLSI), Honolulu, HI, June 2020.<\/li>\n
  3. Chieh Lee, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin and Ya-Chin King<\/strong>*, \u201cMemory-Logic Hybrid Gate with 3D-Stackable Complementary Latches for FinFET-based Neural Networks\u201d 2019 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2019.<\/li>\n
  4. Yi-Pei Tsai, Jiaw-Ren Shih, Ya-Chin King<\/strong> and Chrong Jung Lin*, \u201c7nm FinFET Plasma Charge Recording Device\u201d 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2018.<\/li>\n
  5. Peng-Chun Liou, Tsung-Han Lee, Chien-Ping Wang, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King<\/strong>*, \u201cHigh Resolution Ion Detector (HRID) by 16nm FinFET CMOS Technology\u201d 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, Dec. 2018.<\/li>\n
  6. Wei-Hao Chen, Kai-Xiang Li, Wei-Yu Lin, Kuo-Hsiang Hsu, Pin-Yi Li, Cheng-Han Yang, Cheng-Xin Xue, En-Yu Yang, Yen-Kai Chen, Yun-Sheng Chang, Tzu-Hsiang Hsu, Ya-Chin King<\/strong>, Chorng-Jung Lin, Ren-Shuo Liu, Chih-Cheng Hsieh, Kea-Tiong Tang, Meng-Fan Chang, \u201cA 65nm 1Mb nonvolatile computing-in-memory ReRAM macro with sub-16ns multiply-and-accumulate for binary DNN AI edge processors,\u201d 2018 IEEE International Solid – State Circuits Conference – (ISSCC), San Francisco, CA, April 2018, pp. 494-496.<\/li>\n<\/ol>\n

    \u671f\u520a\u8ad6\u6587<\/strong><\/p>\n

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    1. Kai-Wei Yang, Ting Gan, Jiaw-Ren Shih,\u00a0Chrong Jung Lin,\u00a0Ya-Chin King<\/strong>, \u201dPolarity and Patterning Effect on Plasma Charging Levels by Metal-Gate Coupled Recorder Arrays,\u201d in IEEE Transactions on Electron Devices (TED), doi: 10.1109\/TED.2022.3215486, Oct. 2022.<\/li>\n
    2. Ying-Chun Shen, Chien-Ping Wang, Kun-Lin Liou, Po-Hung Tan, Yi-Chung Wang, Shu-Chi Wu, Tzu-Yi Yang, Yi-Jen Yu, Tsung-Yu Chiang, Yue-Der Chih, Jonathan Chang, Jiaw-Ren Shih,\u00a0Chrong Jung Lin,\u00a0Ya-Chin King*<\/strong>and Yu-Lun Chueh*, \u201cMultifunctional Ion-Sensitive Floating Gate Fin Field-Effect Transistor with Three-Dimensional Nanoseaweed Structure by Glancing Angle Deposition Technology,\u201d in Small, vol. 18, no. 5, pp. 2104168, Feb. 2022.<\/li>\n
    3. Chien-Ping Wang, Burn Jeng Lin, Pin-Jiun Wu, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang,\u00a0Chrong Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cEmbedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology,\u201d in Nanoscale Research Letters (NRL), vol. 17, pp. 5, Jan. 2022.<\/li>\n
    4. Po-Hung Tan, Che-Hao Hsu, Ying-Chun Shen, Chien-Ping Wang, Kun-Lin Liou, Jiaw-Ren Shih,\u00a0Chrong Jung Lin, Ling Lee, Kuangye Wang, Hong-Min Wu, Tsung-Yu Chiang, Yue-Der Chih, Jonathan Chang,\u00a0Ya-Chin King*<\/strong>and Yu-Lun Chueh*, \u201cComplementary Metal\u2013Oxide\u2013Semiconductor Compatible 2D Layered Film-Based Gas Sensors by Floating-Gate Coupling Effect,\u201d in Advanced Functional Materials (AFM), pp. 2108878, Dec. 2021.
      \n(Early Access, doi: https:\/\/doi.org\/10.1002\/adfm.202108878)<\/li>\n
    5. Chien-Ping Wang, Wei-Hwa Lin, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang,\u00a0Chrong Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cBattery-Less Electronic Layer Detectors Array (ELDA) for In-Tool DUV Detection by FinFET CMOS Technology,\u201d in IEEE Transactions on Electron Devices (TED), vol. 68, no. 10, pp. 4972-4976, Oct. 2021.<\/li>\n
    6. Shi Jiun Wang, Chih-An Yang, Burn Jeng Lin,\u00a0Chrong-Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cOn-Wafer Electron Beam Detectors by Floating-Gate FinFET Technologies,\u201d in IEEE Transactions on Electron Devices (TED), vol. 68, no. 9, pp. 4651-4655, Sept. 2021.<\/li>\n
    7. Yun-Feng Kao, Jiaw-Ren Shih,\u00a0Chrong Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cAn Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array,\u201d in Nanoscale Research Letters (NRL), vol. 16, pp. 114, July 2021.<\/li>\n
    8. Yi-Jie Chao, Kai-Wei Yang, Chi Su,\u00a0Chrong-Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cWide range detector of plasma induced charging effect for advanced CMOS BEOL processes,\u201d in Nanoscale Research Letters (NRL), vol. 16, pp. 112, July 2021.<\/li>\n
    9. Chien-Ping Wang, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang,\u00a0Chrong Jung Linand\u00a0Ya-Chin King*<\/strong>, \u201cDetectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology,\u201d in Nanoscale Research Letters (NRL), vol. 16, pp. 93, May 2021.<\/li>\n
    10. Chi Su*, Yi-Pei Tsai, Chrong-Jung Lin and Ya-Chin King<\/strong>, \u201cTest Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes,\u201d in Nanoscale Research Letters (NRL), vol. 15, pp. 96, May 2020.<\/li>\n
    11. Yun-Feng Kao, Chrong Jung Lin and Ya-Chin King<\/strong>*, \u201cReset Variability in Backfilled Resistive Random Access Memory and Its Correlation to Low Frequency Noise in Read,\u201d in IEEE Journal of the Electron Devices Society (JEDS), vol. 8, pp. 465-473, May 2020<\/li>\n
    12. Chien-Ping Wang, Yi-Pei Tsai, Burn Jeng Lin, Zheng-Yong Liang, Po-Wen Chiu, Jiaw-Ren Shih, Chrong Jung Lin and Ya-Chin King<\/strong>*, \u201cOn-Wafer FinFET-Based EUV\/eBeam Detector Arrays for Advanced Lithography Processes,\u201d in IEEE Transactions on Electron Devices (TED), vol. 67, no. 6, pp. 2406-2413, June 2020.<\/li>\n
    13. Chieh Lee, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin and Ya-Chin King<\/strong>*, “Memory-Logic Hybrid Gate With 3-D Stackable Complementary Latches,” in IEEE Transactions on Electron Devices (TED), June 2020.<\/li>\n
    14. Yi-Pei Tsai, Jiaw-Ren Shih, Ya-Chin King<\/strong> and Chrong-Jung Lin*, \u201cPlasma Charge Accumulative Model in Quantitative FinFET Plasma Damage,\u201d in IEEE Transactions on Electron Devices (TED), vol. 66, no. 8, pp. 3492-3497, Aug. 2019.<\/li>\n
    15. Po-Shao Yeh, Chih-An Yang, Yi-Hong Chang, Yue-Der Chih, Chrong-Jung Lin and Ya-Chin King<\/strong>*, \u201cSelf-Convergent Trimming SRAM True Random Number Generation with In-Cell Storage,\u201d in IEEE Journal of Solid-State Circuits, vol. 54, no. 9, pp. 2614-2621, Sept. 2019.<\/li>\n
    16. Ren-Jay Kuo, Fu-Cheng Chang, Ya-Chin King<\/strong> and Chrong-Jung Lin*, \u201cAntifuse OTP Cell in a Cross-Point Array by Advanced CMOS FinFET Process,\u201d in IEEE Transactions on Electron Devices (TED) 66, no. 4, pp. 1729-1733, April 2019.<\/li>\n
    17. Chih Yuan Chen, Chrong-Jung Lin, Ya-Chin King<\/strong>*, \u201cRTN and Annealing Related to Stress and Temperature in FIND RRAM Array\u201d, Nanoscale Research Letter (NRL), vol. 14, pp. 12, Jan 2019.<\/li>\n
    18. Yu-Fan Chiang, Wei-Yu Chien, Yue-Der Chih, Jonathan Chang, Chrong-Jung Lin, Ya-Chin King<\/strong>*, \u201dFinFET CMOS logic gates with non-volatile states for reconfigurable computing systems\u201d Integration the VLSI journal, Dec. 2018.<\/li>\n
    19. Yun-Feng Kao, Wei Cheng Zhuang, Chrong-Jung Lin, Ya-Chin King<\/strong>*, \u201cA Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model\u201d Nanoscale Research Letter (NRL), vol. 13, pp. 213, July 2018.<\/li>\n
    20. Yi-Pei Tsai, Peng-Chun Liou, Chrong Jung Lin and Ya-Chin King<\/strong>*, \u201cPlasma Charging Effect on the Reliability of Copper BEOL Structures in Advanced FinFET Technologies,\u201d in IEEE Journal of the Electron Devices Society (JEDS), vol. 6, pp. 875-883, July 2018.<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"

      \u5091\u51fa\u5b78\u8853\u6703\u8b70: VLSI\u3001IEDM \u53ca ISSCC \u8ad6\u6587 Wei-Hwa Lin, Li Ci Chen, M […]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[1],"tags":[],"_links":{"self":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts\/37"}],"collection":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=37"}],"version-history":[{"count":2,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts\/37\/revisions"}],"predecessor-version":[{"id":1241,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts\/37\/revisions\/1241"}],"wp:attachment":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=37"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=37"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=37"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}