{"id":34,"date":"2018-04-20T21:05:50","date_gmt":"2018-04-20T13:05:50","guid":{"rendered":"http:\/\/well.ee.nthu.edu.tw\/?p=34"},"modified":"2018-04-20T21:05:50","modified_gmt":"2018-04-20T13:05:50","slug":"background_king","status":"publish","type":"post","link":"https:\/\/starlab.ee.nthu.edu.tw\/?p=34","title":{"rendered":"Background_King"},"content":{"rendered":"<p><span style=\"color: #ff0000;\"><strong>\u5b78\u6b77<\/strong><\/span><\/p>\n<ul>\n<li>\u52a0\u5dde\u5927\u5b78\u67cf\u514b\u840a\u5206\u6821<br \/>\n\u96fb\u6a5f\u5de5\u7a0b\u5b78\u535a\u58eb, 1999\/05\u7562<br \/>\n\u5b78\u4f4d\u8ad6\u6587\uff1aThin Dielectric Technology and Memory Devices<\/li>\n<li>\u52a0\u5dde\u5927\u5b78\u67cf\u514b\u840a\u5206\u6821<br \/>\n\u96fb\u6a5f\u5de5\u7a0b\u5b78\u78a9\u58eb, 1994\/12\u7562<br \/>\n\u8ad6\u6587\u984c\u76ee\uff1aTransient Voltage Suppressor for Low-Power Circuit<\/li>\n<li>\u53f0\u7063\u570b\u7acb\u5927\u5b78<br \/>\n\u96fb\u6a5f\u5de5\u7a0b\u5b78\u5b78\u58eb, 1992\/06\u7562<\/li>\n<\/ul>\n<p><span style=\"color: #ff0000;\"><strong>\u7d93\u6b77<\/strong><\/span><\/p>\n<ul>\n<li><strong>\u6e05\u83ef\u5927\u5b78\u96fb\u6a5f\u5de5\u7a0b\u5b78\u7cfb\u6559\u6388\/\u96fb\u5b50\u5de5\u7a0b\u7814\u7a76\u6240\u6559\u6388<\/strong>\uff0c1999\/08\u8fc4\u4eca<br \/>\n\u5be6\u9a57\u5ba4 Semiconductor Technology Application Research\u00a0(STAR)\u00a0Group<\/li>\n<li><strong> SiliconSystems<\/strong> (1995)<br \/>\n\u826f\u7387\u63d0\u5347\u5718\u968a: developing early warning system on testing and SRAM defect analysis<\/li>\n<\/ul>\n<p><strong><span style=\"color: #ff0000;\">\u7814\u7a76\u65b9\u5411<\/span><\/strong><\/p>\n<p>\u8584\u9598\u6975\u4ecb\u96fb\u5c64\u4e4b\u53ef\u9760\u5ea6\uff0c\u975e\u63ee\u767c\u8a18\u61b6\u9ad4\uff0cCMOS\u5f71\u50cf\u611f\u6e2c\u5668\u3002<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p><span style=\"color: #ff0000;\"><b><span lang=\"EN-US\">EDUCATION<\/span><\/b><\/span><\/p>\n<ul>\n<li><strong>University Of California At Berkeley<br \/>\n<\/strong>Ph.D. Electrical Engineering, May 1999<br \/>\nDissertation: Thin Dielectric Technology and Memory Devices<\/li>\n<li><strong>University Of California At Berkeley<br \/>\n<\/strong>M.S. Electrical Engineering, December 1994<br \/>\nThesis Title: Transient Voltage Suppressor for Low-Power Circuit<\/li>\n<li><strong>National Taiwan University<br \/>\n<\/strong>B.S. Electrical Engineering, June 1992<\/li>\n<\/ul>\n<p><span style=\"color: #ff0000;\"><b><span lang=\"EN-US\">EMPLOYMENT<\/span><\/b><\/span><\/p>\n<ul>\n<li><strong>National Tsing-Hua University<\/strong>, Hsinchu, Taiwan(1999 ~)<br \/>\nProfessor in the\u00a0<strong>Electrical Engineering Department, Institute of Electronics Engineering<br \/>\n<\/strong>Lab:\u00a0<a href=\"http:\/\/nthustarlab.gq\/\">Semiconductor Technology Application Research (STAR) Group<\/a><\/li>\n<li><strong>Silicon Systems<\/strong>\u00a0in Santa Cruz, California (1995)<br \/>\nYield Enhancement Group: developing early warning system on testing and SRAM defect analysis.<\/li>\n<\/ul>\n<p><span style=\"color: #ff0000;\"><b><span lang=\"EN-US\">RESEARCH ORIENTATION<\/span><\/b><\/span><\/p>\n<p>Thin gate dielectric reliability, Non-volatile memory, CMOS image sensor.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u5b78\u6b77 \u52a0\u5dde\u5927\u5b78\u67cf\u514b\u840a\u5206\u6821 \u96fb\u6a5f\u5de5\u7a0b\u5b78\u535a\u58eb, 1999\/05\u7562 \u5b78\u4f4d\u8ad6\u6587\uff1aThin Dielectric Tec [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[1],"tags":[],"_links":{"self":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts\/34"}],"collection":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=34"}],"version-history":[{"count":0,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=\/wp\/v2\/posts\/34\/revisions"}],"wp:attachment":[{"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=34"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=34"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/starlab.ee.nthu.edu.tw\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=34"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}